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TTTC's Electronic Broadcasting Service |
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19th IEEE Symposium on Design & Diagnostics of Electronic Circuits & Systems
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CALL FOR PAPERS
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The IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems. Topics of interest include but are not limited to:
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Prospective authors are cordially invited to submit original papers using the electronic submission system at the Symposium web page. Papers in English with a length of 6 pages maximum in IEEE conference style are expected. Specialized student and industrial sessions, as well as embedded tutorials, will be organized at the symposium. Accepted papers will be included in the Symposium Proceedings and submitted for inclusion into IEEE Xplore as well as other Abstracting and Indexing databases (WoS, Scopus, etc). |
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| Additional Information | |
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General Chair Viera Stopjaková Slovak University of Technology Faculty of Electrical Engineering and Information Technology Ilkovičova 2 812 19 Bratislava 3, Slovakia Tel: +421 2 60 291 149
Program Chair Andreas Steininger Vienna University of Technology Institute of Computer Engineering Embedded Computing Systems Treitlstrasse 1-3 1040 Wien, Austria Tel: +43-1-58801-18251
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| Committee | |
General Chair General Vice-Chair: Zoran Stamenković, IHP Frankfurt (Oder) (DE) Program Chair: Andreas Steininger, TU Vienna (AT) Program Vice-Chair: Adam Pawlak, SUT Gliwice (PL) Topic Chairs: · Alberto Bosio, LIRM Montpellier (FR) · Hana Kubátová, CTU Prague (CZ) · Kerstin Schneider-Hornstein, TU Vienna (AT) · Manfred Dietrich, Fraunhofer IIS Dresden (DE) Organizing Committee Chair: Katarína Jelemenská, STU Bratislava (SK) Steering Committee: · V. Stopjaková, chair (SK) · M. Baláž (SK) · T. Garbolino (PL) · E. Hrynkiewicz (PL) · A. Kraśniewski (PL) · H. Manhaeve (BE) · O. Novák (CZ) · A. Pataricza (HU) · A. Pawlak (PL) · W. Pleskacz (PL) · J. Raik (EE) · M. Renovell (FR) · L. Sekanina (CZ) · Z. Stamenković (DE) · A. Steininger (AT) · H.T. Vierhaus (DE) · K. Vlček (CZ) Program Committee: · W. Anheier (DE) · D. Arbet (SK) · S. Aunet (NO) · M. Baláž (SK) · S. Bernard (FR) · T. Borejko (PL) · A. Bosio (FR) · G. Cserey (HU) · A. Dabrowski (PL) · M. Daněk (CZ) · M. Dietrich (DE) · R. Drechsler (DE) · M. Drutarovský (SK) · P. Ellervee (EE) · G. Fey (DE) · P. Fišer (CZ) · P. Földesy (HU) · M. Függer (AT) · T. Garbolino (PL) · P. Girard (FR) · D. Gizopoulos (GR) · E. Gramatová (SK) · S. Hellebrand (DE) · E. Hrynkiewicz (PL) · K. Jelemenská (SK) · M. Jenihhin (EE) · G. Jervan (EE) · L. Jozwiak (NL) · D. Kasprovicz (PL) · P. Kitsos (GR) · Z. Kotásek (CZ) · R. Kraemer (DE) · A. Kraśniewski (PL) · M. Krstic (DE) · H. Kubátová (CZ) · W. Kuzmicz (PL) · E. Larsson (SE) · R. Leveugle (FR · H. Manhaeve (BE) · L. Nagy (SK) · O. Novák (CZ) · T. Ostermann (AT) · A. Pataricza (HU) · A. Pawlak (PL) · Z. Peng (SE) · L. Pierre (FR) · S. Piestrak (FR) · W. Pleskacz (PL) · A. Pleštil (CZ) · T. Polzer (AT) · P. Prinetto (IT) · Z. Raida (CZ) · J. Raik (EE) · M. Renovell (FR) · B. Rouzeyre (FR) · R. Růžička (CZ) · S. Sattler (DE) · K. Schneider-Hornstein (AT) · M. Schölzel (DE) · J. Segura (ES) · L. Sekanina (CZ) · M. Sonza Reorda (IT) · J. Sosnowski (PL) · Z. Stamenković (DE) · A. Steininger (AT) · V. Stopjaková (SK) · O. Šubrt (CZ) · K. Tammemäe (EE) · M. Taouil (NL) · P. Teixeira (PT) · R. Ubar (EE) · M. Udrescu (RO) · D. Vazquez-Garcia (ES) · H.T. Vierhaus (DE) · K. Vlček (CZ) · H.J. Wunderlich (DE)
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| For more information, visit us on the web at: http://www.ddecs.org/ddecs2016 |
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The 19th IEEE Symposium on Design & Diagnostics of Electronic Circuits & Systems is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE
Computer Society- Test Technology Technical Council |
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